Tao KE
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Panning and multi-baseline digital close-range photogrammetry - art. no. 678813
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Journal:MIPPR 2007: PATTERN RECOGNITION AND COMPUTER VISION

Key Words:panning, multi-baseline, digital photogrammetry, close-range photogrammetry, DLT.

Abstract:The most methods of close-range photogrammetry are based on Direct Linear Transformation (DLT). But DLT often has unstable solution and every image needs more than six ground control points to compute DLT parameters, so this method is hard to acquire the high accuracy and its efficiency is low. The paper discusses a new method of digital close-range photogrammetry---panning and multi-baseline digital close-range photogrammetry. This method enlarges the intersection angle and improves the intersection precision by multi-baseline. At the same time this method applies the classic aerotriangulation and bundle adjustment to the close-range photogrammetry, we need more than three ground control points to compute the exterior orientation elements of all images. The experiments prove that this method can acquire the high accuracy.

Co-author:ZuXun Zhang,JianQing Zhang

First Author:Tao Ke

Volume:6788

Issue:0277-786X

Translation or Not:no

Date of Publication:2007-11-29

Included Journals:EI、CPCI-S

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School/Department:遥感信息工程学院

Education Level:研究生毕业

Business Address:信息学部教学实验大楼

Gender:Male

Status:Employed

Alma Mater:武汉大学

Discipline:Photogrammetry and Remote Sensing

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