Defects and reliability of high K gate stacks on Si, Ge and III-Vs
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DOI码：10.1109/ICSICT.2016.7998961
发表刊物：2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2016 - Proceedings
是否译文：否
发表时间：1905-07-08