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宽禁带半导体的缺陷、界面、器件、制备工艺、封装工艺的多尺度建模仿真，及其对器件性能影响
宽禁带半导体的缺陷、界面、器件、制备工艺、封装工艺的多尺度建模仿真，及其对器件性能影响
